Nanometer Calibration StandardsTools for Nanotechnology
Accurate measurement requires accurate calibration and consistent accurate calibration requires standards checked and traceable back to the internationally organizations. Accurate and reliable standards are essential for periodic calibration check and correction.
SPI Supplies traceable calibration specimens meet those needs at the nanometer scale. These specimens are useable with a variety of measurement tools such as the AFM, SPM, SEM, Auger and TOF-SIMS. These specimens are available both as manufactured reference specimen (non-traceable) and as a traceable, certified standard.
Find your best match using the Product Guide.