High quality silicon AFM probes
Minimal probe to probe variation
Designed to quickly downsize large substrates into smaller pieces
Use for Glass, Quartz, Silicon, Sapphire, YSZ.
Carbide or diamond scribing wheel
Substrates produced from single crystal sapphire.
Excellent optical, physical and chemical properties.
Good for high temperature applications.
Digital wireless recording system.
Ideal for in-situ measurements in isolated chambers.
Supports multi-user access and remote control.
Built-in LED array provides all around illumination.
3.5 cm (1.4 inch) viewing area.
Includes a 30 mm scale (0.1 mm divisions).
Removes hydrocarbon films without affecting underlying substrates.
Improves FE-SEM resolution.
Programmable for reproducible results.