Model 301BE / 292UTC
Model 301BE / 292UTC
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Model 301BE / 292UTC

High Magnification, High Resolution Calibration Reference and Traceable Standard For: AFM, SEM, Auger and FIB instruments
One-dimensional grating, Titanium lines on Silicon wafer, 3 x 4mm
Pitch: 292 nm pitch.
Line Height: 30nm.

Model 301BE is non-traceable Calibration Reference
Model 292UTC is Traceable, Certified Standards

Items in Model 301BE / 292UTC