Geller Magnification Reference StandardsThese highly innovative, useful and unique products are magnification calibration standards for ISO-9000 certification procedures. One standard addresses magnification calibration for light microscopy (transmitted & vertical illumination), confocal microscopy, SEM (backscattered & secondary) and even TEM (using a bulk holder for secondary electron imaging)! This NIST traceable stage micrometer standard has a useful range for horizontal and vertical axes at any magnification from 10X to 50,000X. Can also be used for particle size counting calibration and resolution testing. Your selection of the proper standard will depend on the resolution that you wish to achieve and the number and type of artifacts as well as X, Y and Z calibration needs.
Items in Geller Magnification Reference Standards