Silicon Half Grid - Lift Out Grid with Continuous Surface, Pkg 10

Silicon Half Grid - Lift Out Grid with Continuous Surface, Pkg 10
Silicon Half Grid - Lift Out Grid with Continuous Surface, Pkg 10
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Item390SHGC-BA

Dune Sciences’ Silicon Half Grids for FIB sample preparation offer a dramatic improvement in the preparation of in-situ FIB specimen for TEM, tomography, and atom probe from virtually any material. Silicon provides an ultra-clean, metal-free substrate that readily bonds with Pt and can easily be modified to match your sample geometry.

Features and benefits:
  • Standard 3 mm geometry with 100 um thickness fits in any TEM and FIB preparation sample holder.
  • B-doped conductive silicon minimizes charging during sample preparation and TEM imaging.
  • Rigid substrate will not bend to improve handling, especially for multi-step processing/imaging.
  • Metal-free silicon grids eliminate heavy elements from EDS spectra.
  • Substrate "O" mark on one side identifies grid orientation.
  • Ideal for broad range of applications including semiconductors, cryoFIB preparation, and for fixed/embedded soft materials.
  • Beveled surface of silicon half grids mate to bottom cut of FIB lamella to improve bonding and reduce build-up of platinum.
  • Created using the same state-of-the-art microfabrication methods as the functionalized SMART TEM Grids, Dune’s FIB grids are robust, easy to handle, and simple to use.