SPI Supplies Brand Aluminum Tungsten SEM Image Performance Checker Specimen
This specimen with a unique structure, for probes in the size range of 25nm to 75nm, is used for conduction gap and grey level testing. It requires no surface coating, is 100% non-magnetic, vacuum clean, UHV compatible and responds favorably to an electron probe.
Please be sure to specify which mount selection is your preference when ordering. Need help? Go to SPI SEM Mount section of the electronic catalog. Each SPI Performance Checker Mount is shipped with complete User Instructions. Be sure to select from among the large number of different aluminum mounts, we do not recommend mounting of this test sample on a carbon mount.