SPARK 350 Pt Conductive AFM Probes - Pk 10

SPARK 350 Pt Conductive AFM Probes -  Pk 10
SPARK 350 Pt Conductive AFM Probes - Pk 10
$450.00
AvailabilityContact for Availability
Item01079-AB

SPARK 350 Pt Conductive AFM Probes 

Robust, high-resolution probes for electrical characterization. Rigorous inspection of every probe means each one performs as you expect. Pack of 10 conductive AFM probes with platinum coating on both sides, suitable for electrical characterization in AC modes (non-contact/tapping). 40 nm platinum coating with a 5nm titanium adhesion layer on both sides of the probe and a tip radius of less than 30 nm.

Cantilever Specifications

Parameter Nominal Range
Spring constant (N/m) 42 25 - 70
Resonant frequency (kHz) 350 300 - 400
Shape Rectangular
Length (µm)  125 123 - 127
Width (µm)  30 28 - 32
Thickness (µm)  4.5 4.0 - 5.0
Material Silicon (n-type, Antimony)
Resistivity (Ωcm) 0.02 0.015 - 0.025

Tip Specification

Parameter Nominal Range
Radius (nm) 18 < 30
Height (µm) 6 5 - 8
Set back (µm) 7.5 6.5 - 8.5
Shape Conical
Cone Angle (°) 25 15 - 40
Material Silicon (n-type, Antimony)
Resistivity (Ωcm) 0.02 0.015 - 0.025

Coatings

Frontside/Tip
    5nm Ti
    40nm Pl

Backside/Reflective 
    5nm Ti
    40nm Pt

Note: Nominal values for spring constants and resonant frequencies are calculated using well-known formulae and based on expected probe dimensions. The ranges are calculated using measured dimensions.