Model 301BE / 292UTC
Model 301BE / 292UTC
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Model 301BE / 292UTC

High Magnification, High Resolution Calibration Tool

  • Instruments: AFM, SEM, Auger and FIB.
  • Pitch: 292 nm pitch.
  • Line Height: 30nm.
  • Feature: One-dimensional grating.
  • Material: Titanium lines on Silicon wafer.
  • Size: 3 x 4mm.
Model 301BE is non-traceable Calibration Reference
Model 292UTC is Traceable, Certified Standards

Items in Model 301BE / 292UTC