SC-2000 SEM Sample Preparation System by Technoorg Linda

SC-2000 SEM Sample Preparation System by Technoorg Linda
SC-2000 SEM Sample Preparation System by Technoorg Linda
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Item19025-AB
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SC-2000 SEM Sample Preparation System

The SC-2000 model is equipped both with high- and low-energy ion sources. Rapid slope cutting with the high-energy ion gun followed by gentle surface cleaning with the low-energy ion gun provides cross-sectional SEM samples suitable for semiconductor failure analysis and other analytical purposes. The system also provides an ion milling based solution for improving and cleaning of mechanically polished SEM samples and preparation of damage-free surfaces for EBSD technique.

  • Cross-sectional sample preparation by slope cutting
  • Final polishing and cleaning of traditional SEM and EBSD samples
  • High-energy ion gun for rapid milling
  • Low-energy ion gun for gentle surface polishing and cleaning
  • Automated parameter settings and operation
  • Sample rotation and oscillation
  • Site-specific sample preparation with high-precision positioning
  • Real-time monitoring of the milling process by high resolution CCD camera and TFT monitor