70-1D mounted FEI/Leica/LEO/Cambridge/Philips Pin-Type Mount 12.7(table)X3.2(pin)X 8.0mm(length)

70-1D mounted FEI/Leica/LEO/Cambridge/Philips Pin-Type Mount 12.7(table)X3.2(pin)X 8.0mm(length)
70-1D mounted FEI/Leica/LEO/Cambridge/Philips Pin-Type Mount 12.7(table)X3.2(pin)X 8.0mm(length)
$5,805.00
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Item1506701DUTCM-AB

For General Purpose and Metrology Microscopes

A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.

Period: 70 nm pitch, one-dimensional array. Refer to calibration certificate for actual pitch.

Surface: Silicon Oxide ridges on Silicon, 4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. The specimens are produced by a series of process steps including interferometric lithography. The period of the line-space pattern is uniform without stitching errors.