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SEM (Scanning Electron Microscopy)Two JEOL Model 840 SEMs are the core of the SEM capability. Capable of high resolution in the secondary electron mode of operation, interfaced to the instrument is a Tracor (now NORAN Instruments) energy dispersive x-ray spectroscopy (EDS) system and also an Oxford/Hexland cryo-transfer mechanism and stage for low temperature "cryo" studies on all types of materials. This particular SEM was built to handle unusually large specimens. Observation of any point on the surface of objects 4" (100mm) in diameter is routine, and specimens as long as 8" (200mm) can be examined with some limitations. Such large specimen capability is of great importance and value for many court important samples that just can not be cut up and examined destructively. |
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TEM (Transmission Electron Microscopy)The core capability is based on a JEOL 100CX analytical TEM with full capability for selected area electron diffraction and darkfield electron microscopy and a Tracor (now NORAN Instruments) EDS system. Full tilt capabilities are available on the goniometer stage which also permit the taking of micrographs as stereo pairs.Ancillary capabilities include two different vacuum evaporators ( SPI Vacu Prep, Denton DV 502), Gatan duo beam ion mill for full ion beam thinning capability, "Dimpler" for use in the first step toward the preparation of silicon wafer samples for TEM, complete equipment for tripod polishing and also full capabilities for the thin foiling of metallurgical samples. Complete Pt/C replication capabilities are available using the SPI Vacu Prep vacuum evaporator. |
single crystals of poly-3, 3-bis (chloromethyl)-oxacyclobutane", Garber, C. A., and P. H. Geil, J. Appl. Phys., 4034 (1966) |
(TM)
II Image Analyzing Computer.
This proprietary system, which is available for sale through SPI Supplies, uses
CCD television technology and the Image ProPlus software package to provide a
wide range of image analysis capabilities. Typical applications include particle
size characterization, percent void area, fiber length and phase distribution
analysis. Input can be through direct imaging reflected, or transmitted light
microscopy, or electron microscopy. Scanning and transmission electron images
are input through micrographs.To Ask a Question or Make a Comment
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