SPI Supplies will be closed on November 26th & 27th in observance of Thanksgiving.
Orders placed during this time will be processed on Monday, November 30th.
Returning customer? Request an account for our new website on the contact form.
This highly innovative and useful and unique product is a magnification calibration standard for ISO-9000 certification procedures. This one standard addresses magnification calibration for light microscopy (transmitted & vertical illumination), confocal microscopy, SEM (backscattered & secondary) and even TEM (using a bulk holder for secondary electron imaging)! This NIST traceable stage micrometer standard has a useful range for horizontal and vertical axes at any magnification from 10X to 50,000X. Can also be used for particle size counting calibration and resolution testing.
Size: approximately 9 X 9 X 2.0 mm
Construction: fused silica base with coating of ITO (optically transparent and electrically conductive (100nm) and anti-reflective chromium (100nm) to form the pattern. Retainers are available for ease of handling and protecting the MRS-3. Specify your make and model of microscope. The most common retainer (SEM/R) is 1"" OD X 1/8"" thick. It has a hole in the center for transmitted optical illumination.
Retainers are available and highly recommended for ease of handling and protecting the MRS-3. Specify your make and model of microscope. The most common retainer (SEM/R) is 1"" OD X 1/8"" thick. It has a hole in the center for transmitted optical illumination. It is designed specifically for any SEM stage capable of taking a one inch metallographic mount.
The step height is 100 nm in the vertical direction. The z-calibration is not useful for light microscopy or SEM but can be very useful for confocal and any type of profilometry.