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Calibration & Reference Standards
Calibration & Reference Standards

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Calibration & Reference Standards

This highly innovative and useful and unique product is a magnification calibration standard for ISO-9000 certification procedures. This one standard addresses magnification calibration for light microscopy (transmitted & vertical illumination), confocal microscopy, SEM (backscattered & secondary) and even TEM (using a bulk holder for secondary electron imaging)! This NIST traceable stage micrometer standard has a useful range for horizontal and vertical axes at any magnification from 10X to 50,000X. Can also be used for particle size counting calibration and resolution testing.

Technical Specifications

Size: approximately 9 X 9 X 2.0 mm
Construction: fused silica base with coating of ITO (optically transparent and electrically conductive (100nm) and anti-reflective chromium (100nm) to form the pattern. Retainers are available for ease of handling and protecting the MRS-3. Specify your make and model of microscope. The most common retainer (SEM/R) is 1"" OD X 1/8"" thick. It has a hole in the center for transmitted optical illumination.

Retainers are available and highly recommended for ease of handling and protecting the MRS-3. Specify your make and model of microscope. The most common retainer (SEM/R) is 1"" OD X 1/8"" thick. It has a hole in the center for transmitted optical illumination. It is designed specifically for any SEM stage capable of taking a one inch metallographic mount.

Z-direction calibration:

The step height is 100 nm in the vertical direction. The z-calibration is not useful for light microscopy or SEM but can be very useful for confocal and any type of profilometry.