| Element | % |
| Si | 19.30 |
| Ni | 80.70 |
|
|
| Sum | 100.0 |
|
|  | |
| 200 µ m
| |
|
This is a reflected light micrograph of a polished, carbon coated synthetic nickel silicide
crystals. The identifying etched label, which is a feature
of our standards, is invaluable for navigating in an electron beam instrument.
The composition of this material departs from that of most of the others in this set,
i.e. silicates or sulfides. This may provide an alternative standard under certain
circumstances.
|