SPI Supplies

Fluorite (Synthetic) CaF2

Source: Harshaw Chemical Corporation, USA

Element%
F48.67
Ca51.33

Sum100.0
200 µ m
This is a reflected light micrograph of a polished, carbon coated synthetic fluorite crystal. The identifying etched label, which is a feature of our standards, is invaluable for navigating in an electron beam instrument. Of course, fluorine, being a very light element, emits only low energy X-rays which are easily absorbed, hence the need for a standard with plenty of F. Quantitative analysis of fluorine is particularly difficult, as documented by Ottolini et al. (2000) Amer. Min. 85, 89-107. Fluorite has four good octahedral cleavages which results in polished surfaces often having a pitted appearance where the cleavages come together in a re-entrant. This mineral gives its name to the element fluorine, and itself is named from the Latin fluere - to flow - in allusion to easy melting when used as a flux in the smelting of metals.
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Cautionary Note
The compositional and other data shown here are intended to convey typical values for this item and do not neccessarily correspond in detail to standard mounts supplied in the past or to be supplied in the future. Items are changed from time to time as stock is exhausted or alternate choices are preferred. These data should, however, give someone contemplating the purchase of an SPI standard a fair indication of what they may expect to receive. Records are kept of all mounts sold so that, should you lose your documentation at some time in the future, we will be happy to replace it at no charge.



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Wednesday July 09, 2008
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