This sample is a partially graphitized specimen, supported by a high purity,
structureless and featureless carbon film, itself on a copper grid. In
diffraction mode, this specimen provides a lattice spacing of 0.34nm and
being that this is a materials constant, it works as an outstanding
resolution test specimen. Supplied on a 3.05 mm 200 mesh copper grid.
|
|
To Ask a Question or Make a Comment