SPI NiOX™ Test Specimen for Analytical TEM
Calibration aid for the analytical electron microscope
This single test specimen provides characteristic carbon, oxygen, nickel and molybdenum x-ray lines for quantitative measurements of hole count, energy resolution, collection solid angle and long-wavelength absorption, all useful in calibration and performance checking of the analytical electron microscope. In addition, it is useful for calibrating electron diffraction and EELS capabilities. Besides its use in routine calibration to check for detector icing and/or contamination, this specimen is particularly useful in evaluation protocols prior to purchase and on installation. Each NiOX test specimen is accompanied with complete
instructions for use
.
Substrate grid specifications:
Sample is mounted on an SPI # 4120M-MB 200 mesh molybdenum TEM grid.
Bright-field TEM micrograph of
a 47 nm film of NiO on 30 nm
carbon
Selected-area electron diffraction
pattern of the NiO/carbon specimen
Selected-area diffraction pattern
of a nickel film removed from
its NaCl substrate.
SPI #
Each
In Stock
02200-AB
$ 236.07
Yes
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Wednesday May 14, 2008
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