SPI Supplies Instructions for Use of

SPI NiOX™ Test Specimen

Tool for comprehensive evaluation of the analytical electron microscope

The SPI Supplies NiOX™ Test Specimen consists of a uniform thin film of nickel oxide on a molybdenum support grid. It can be used for the following six test protocols. Please let us know if you think of more!

1. To test for stray electrons and x-rays in a TEM column, measure the Ni K/MoK count ratio with the electron beam near the center of the test specimen and in the center of a grid square. Typical values for this ratio are in the range of 3 to 7 for modern TEMs. This test should not be performed if you use a molybdenum condenser aperture.

2. To test for the total contribution of the instrument to the EDS spectrum background, measure the total integrated counts, P (above background), in the NiK peak and the flat background B500 integrated over 500 eV (the average of the two regions on either side of the peak). The peak/background ratio is P/B = 50 x P/B500. For 100 to 200 kV accelerating voltage and probe diameters in the range 20 to 200 nm, P/B should be at least 1000, and more modern instruments may give a value closer to 3000.

3. Measurement of the full width at half maximum of the NiK peak {FWHM (Ni)} allows the energy resolution of the EDS detector using MnK radiation to be estimated as FWHM(Mn) 0.926 x FWHM(Ni). For a light-element detector, FWHM(O) should be lower by a factor of 1.6. Thereference for the assumption of the 0.926 factor is Bennett and Egerton, J. Microsc. Soc. Amer. 1 (1995) 143-150. It is based on OK and NiK FWHM's measured on both Si(Li) and Ge detectors.

4. The collection solid angle of the EDS detector (in sterad) is given by omega = 4.05 x P/(t x x I), where P is the characteristic NiK counts recorded in a live time of seconds with a probe current of I picoamperes, measured using a picoammeter connected to the TEM screen, to a Faraday cup or if to a spectrometer made by Gatan, Inc., to the flight tube and t ( 50) is the thickness in nm of the NiO film.

5. For windowless and thin-window EDS detectors, the OK /NiK count ratio is typically 0.2. The theoretical value is 0.73. If the measured ratio decreases with time, check for a buildup of ice or hydrocarbon on the detector or on the window.

6. For E-axis calibration in electron energy loss spectroscopy, the OK edge should appear at 533 eV and the NiLedge at 854 eV if they are measured at the point of maximum slope. A measurement of the areas under these two edges provides a test of the EELS quantification procedure.


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Sunday March 21, 2010
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