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MAG*I*CAL® TEM Calibration Specimen

Certificate of Traceability

The MAG*I*CAL® calibration sample is manufactured from a single crystal silicon wafer, and so incorporates a fundamental constant of nature into the sample itself - the crystal lattice constant of silicon. All calibration markings on the sample are directly referenced to this natural constant. The sample calibration values can be verified by the user through observing the crystal lattice image of the silicon substrate and validating the calibrated markings.

National Metrology Institutes (NMI's) such as NRC in Canada, NIST in the USA , NPL in Great Britain, etc., certify measurements as traceable to fundamental constants of nature. They do not certify these natural constants. The MAG*I*CAL® calibration sample does not require NMI certification since the calibration is directly traceable to a natural constant available on the sample itself, and all calibration spacings can be verified by the user. The crystalline lattice spacing is an intrinsic property of a material. For pure silicon, the spacing has been well characterized and documented by the scientific community. It is known to better than 6 decimal places (0.313 560 nm). This value can be obtained from the CRC Handbook of Chemistry and Physics 1, amongst other references.

Documents that request a reference to traceability for the MAG*I*CAL® should be filled in with "natural constant" or "directly traceable to a fundamental constant of nature".1

1 CRC Handbook of Chemistry and Physics, CRC Press, Inc., Boca Raton, Florida 33431

Acknowledgement: Norrox Scientific, Ltd.

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Tuesday February 07, 2012
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