MAG*I*CAL TEM Calibration Sample
Certification considerations
With regard to the traceability and certification of the MAG*I*CAL™
calibration sample, each sample is grown on <001> oriented single crystal
silicon, and all spacings on the sample are directly referenced to the cross
-sectional (111) lattice spacing of silicon on the sample itself. This
spacing is visible by lattice imaging on the sample itself, allowing each
sample to be self-calibrating. Each unit comes with a numbered certificate,
the text of which is included below. This certificate has been used for
ISO 9000 certification, with the argument that the sample is self-
calibrating against the (111) lattice spacing of silicon (a fundamental
constant), and to our knowledge, this is the highest quality TEM
calibration sample available anywhere in the world at this time.
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Saturday October 11, 2008
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