MAG*I*CAL^® TEM Calibration Specimen

Chinese

Developed over a period of years at one of Canada's premier research institutions, this unique calibration sample for use in all transmission electron microscopes (TEMs) can be used to perform all of the three major calibrations for a TEM: 1) Magnification at all magnification ranges 2) Camera constant 3) Image-diffraction pattern rotation calibrations With this newly developed single crystal material, a single sample can replace up to five other calibration samples. While the sample itself was developed by materials scientists using materials science techniques, life scientists doing TEM will find the use of this calibration aid to be equally useful. We also believe the Mag*I*cal TEM Calibration Sample will come about as close as one could get to having a "certified standard". A Certificate of Analysis accompanies each Mag*I*Cal sample that is shipped to a customer. And we are now sending with each Mag*I*Cal a Certificate of Traceability.

Figure 1: Diagram of the Mag*I*Cal Calibration Sample

Description of the Mag*I*Cal Calibration Sample The sample itself is an ion milled cross-section of a single crystal of silicon. In this single crystal are a series of atomically flat layers of Si and SiGe. They have been produced to electronic device quality by molecular beam epitaxy (MBE). The thickness and spacing of these layers are very accurately known, since they have been directly referenced to the (111) crystal lattice spacings of silicon, which are readily visible right on the sample. The layer spacings are designed so that the sample can be used to calibrate the entire magnification range in a TEM, from about 1000X up to 1,000,000X. No other sample in the world can cover this broad of a range of magnifications! Since the sample itself is a single crystal, it can also be used to perform the camera constant calibration and also the image-diffraction pattern rotation calibration. Thickness of the Mag*I*Cal Calibration Sample The thickness of the sample varies from about 10 nm at the edge of the perforation (the thinnest regions closest to the perforation contain too much amorphized material at both surfaces to be useful) to about 50 µm at the very edge of the grid. The useful area for TEM purposes depends on the TEM accelerating voltage, but generally thicknesses of up to 1 µm are usable in all modern TEMs. The "thickening" rate varies with each sample, but the angle of the sample material near the perforation is about 10° or less (for example, for 10°, the sample would be about 1 µm thick at a position about 5 µm in from the perforation). If after reading a more extensive description of the product, and you still have questions, let us know and we will try our best to answer them. If one is using an x-ray spot, and if the spot size is about 5 µm diameter, and the spot was positioned in the thinnest region of the sample, the average thickness will be 2.5 µm, but would vary across the sample from 0 to 5 µm thickness. And of course, the sample comes with simple, easy to follow instructions for all calibrations.

Figure 2

	SPI #	Each		In Stock
MAG*I*Cal TEM Calibration Specimen	02218-AB	$ 1200.00		Yes