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This is a reflected light micrograph of a polished, carbon coated boron lump. The identifying etched label, which is a feature of our standards, is invaluable for navigating in an electron beam instrument.
Note that boron is extremely hard and therefore stands proud above the surrounding surface.
The trace element composition (ppm) has been determined by XRF as follows: Mg=185, Al=81, Si=2400, P-32, S=25, K=12, Ca=187, Ti=9, Cr=34, Mn=1630, Fe=514, Co=13, Ni=27, Cu=52, Zr=3, Nb=3, W=34
Source: lump- #00430, Alfa Aesar, MA, USA
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