At the right is a reflected light micrograph of polished, carbon coated beryllium wire in a 02751-AB mount. The identifying etched label, which is a feature of our standards, is invaluable for navigating in an electron beam instrument.
The trace element concentration (ppm) has been determined by XRF as follows: Na=14, Mg=11, Al=165, Si=200, S=7, Ti=37, Cr=14, Mn=6, Fe=220, Ni=32, Cu=6, Zr=2, U=3
The BeKā X-rays are too low in energy to be seen in spectra collected by EDS, which is why the spectrum shown here is entirely continuum.
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