Semiconductor fabs with defect review tool SEMs (DRTs) have a critical need to monitor the performance of their systems. The cost of running a fab where defects are not analyzed correctly is prohibitive.
The Wafer X-Checker contains all the standard materials needed to monitor the resolution, calibration, light-element sensitivity, and low-end noise performance of your DRT, right on a silicon wafer.
It is available in 200mm and 300mm diameter to fit any DRT. If you don't have a way to monitor the performance of your DRT, you don't know if it is giving you the right answers. Can you afford to run your fab like this?
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