Characteristic of the X-Checker and X-Checker Extra:
- 1) Spectrum calibration with aluminum and copper.
- 2) Low energy spectrum calibration with carbon and aluminum.
- 3) Manganese full-width at half-max resolution measurement.
- 4) Low energy sensitivity test for monitoring contamination on detector window.
- 5) Two nickel grid sizes (high and low magnification) for checking image processing software and magnification calibration.
- 6) Backscattered electron detector performance
Specifications for the hole size of the grids:
40 µm x 40 µm (1,600 µm²) +/- 5%
18 µm x 18 µm ( 324 µm²) +/- 5%
The X-Checker comes on a standard 1" (25.4 mm) "metallographic size"
mount, and will fit into virtually any commercially manufactured SEM, from
very old to very new. For the operator of a busy SEM/EDS system, one can quickly confirm detector resolution (peak width at
half maximum) and energy calibration on either Mn or Ni to make sure the window is not
contaminated. Check for low atomic number sensitivity and calibrate image
analysis software.
X-Checker Extra (Additional features)
- This product contains all of the above features plus the following:
- 7) Boron Nitride to check low end of the spectrum energy performance
- 8) "Fluorine" source (PTFE) to check the low energy end of the spectrum resolution
- 9) And a beryllium (Be) grid for checking the low end sensitivity of high performance detectors
X-Checker Extra Extra (Additional features)
- This product contains all of the above features plus the following:
- 10) Built in Faraday Cup
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