Model #ACT Silicon Non-contact ( Tapping™) Mode

Designed to fit into all commercially made atomic force microscopes (AFMs).

The Applied Nanostructures ACT probe is designed to fit in all commercially made AFMs. The probes are made out of heavily doped single crystal silicon. The tip is pyramidal in shape.

Specifications:

	Parameter	Typical Value	Range
Cantilever	Thickness (µm)	4	3.5 – 4.5
	Width (µm)	40	35 - 45
	Length (µm)	125	115 – 140
	Resonant Frequency (kHz)	300	200 - 400
	Spring Constant (N/m)	40	25 - 75
Tip	Height (µm)	14	12 - 16
Tip	Radius (nm)	10	Less than 10 nm
Coating	None

Applications: AC/Non-contact/Tapping Mode imaging in air or fluid.

Uncoated (no aluminum coating)

# Per Pack	SPI #	Each Pack	In Stock
10	ACT10-AB	$296.48	No
20	ACT20-AB	551.75	No
50	ACT50-AB	1122.59	No
200	ACT200-AB	3595.89	No
400	ACT400-AB	6219.95	No

Aluminum coated on back side, ~ 30 nm

# Per Pack	SPI #	Each Pack	In Stock
10	ACTA10-AB	$296.48	No
20	ACTA20-AB	551.75	No
50	ACTA50-AB	1122.59	No
200	ACTA200-AB	3595.89	No
400	ACTA400-AB	6219.95	No

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