AFM Probe Tips

Model #SICON - Silicon Contact Mode Probe

Introduction:
The SICON silicon contact mode probe tips are designed to fit in all commercially made atomic force microscopes (AFMs). The probes are made from heavily doped single crystal silicon. The tip is pyramidal in shape.

Specifications:

	Parameter	Typical Value	Range
Cantilever	Thickness (µm)	2	2.0 - 3.0
	Width (µm)	45	35 - 45
	Length (µm)	450	425 – 475
	Resonant Frequency (kHz)	12	11 - 50
	Spring Constant (N/m)	2.0
Tip	Height (µm)	14	12 - 16
Tip	Radius (nm)	5-6	Less than 10 nm
Coating	Optional: Cr(3nm) / Pt (20nm) both sides

Uncoated (no aluminum coating)
# Per Pack	SPI #	Each Pack	In Stock
10	SICON10-AB	$296.48	No
20	SICON20-AB	551.75	No
50	SICON50-AB	1122.59	No
200	SICON200-AB	3595.89	No
410	SICON410-AB	6219.95	No

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