
LEIT-C-Plast Carbon Cement
Instructions for Use
Leit-C-Plast "Carbon Cement" is a special adhesive material for the preparation or
large specimens for scanning electron microscopy (SEM) and energy dispersive
spectroscopy (EDS). Return to the product page in order to place an order for Leit-C-Plast.
Characteristics:
- High electrical conductivity
- Permanent plasticity
- Vacuum compatible/stable
- High adhesive strength
- Absent are any peaks that would show up in an EDS spectrum
Instructions for Use:
Leit-C-Plast is rolled and flattened between two plastic plates that are
supplied with the kit. A small amount of Leit-C-Plast is separated with a
spatula, applied to a sample mount (sometimes called the stub) and if
necessary, further distributed with a glass rod.
The specimen to be examined is then pressed in to the adhesive material
already applied to the sample mount. Specimens that are not conductive may
immediately be either sputter or
carbon coated, or if examination will be by FESEM, either
chromium or
osmium coated.
For reorientation on the specimen mount, or preservation of the specimen
separated from the mount, the sample maybe removed by literally lifting it
off of the adhesive. Small traces of Leit-C-Plast are easily removed by the
use of alcohol.
Because of the permanent viscoelasticity of Leit-C-Plast, very large
specimens can be mounted surrounded by a ring of Leit-C-Plast and then when
appropriate, the large specimen can be reoriented on the mount without
difficulty.
For the most precise work, sometimes a combination of
Tempfix and
Leit-C-Plast is recommended. With this protocol, the specimen if fixed
to the surface of the sample mount with solvent-free low melting point
Tempfix. The next step is to apply the electrically conductive Leit-C-Plast
as a conductive bridge between the specimen and the Tempfix. The
combination system can be inserted directly into the vacuum at this point
because of their vacuum compatibility.
Thin strands of ether Leit-C-Plast or Tempfix can be drawn down to a fiber
point, which can be used as a pointer for special features that will later
be examined by SEM.
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Monday March 22, 2010
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