Description:
Applied NanoStructures’ ANSCM-PC probe is designed to fit in all AFMs. The
probes are made out of heavily doped single crystal silicon. The tip is
pyramidal in shape.
Contact Mode Probes
Specifications:
|
|
Parameter |
Typical Value |
Range |
|
Cantilever
|
Thickness (µm) |
2 |
1.5– 2.5 |
|
Width (µm) |
40 |
35 - 45 |
|
|
Length (µm) |
450 |
425 - 475 |
|
|
Resonant Frequency (kHz) |
12 |
11 - 15 |
|
|
Spring Constant(N/m) |
0.2 |
|
|
|
Tip |
Height (µm) |
14 |
12 - 16 |
|
Radius (nm) |
20 |
Less than 25 nm |
|
|
Coating |
Cr (3nm) / Pt (20nm) both sides |
||
