Description:
Applied NanoStructures’ ANSCM-PT probe is designed to fit in all AFMs. The
probes are made out of heavily doped single crystal silicon. The tip is
pyramidal in shape.
TappingMode™ Probes
Specifications:
|
|
Parameter |
Typical Value |
Range |
|
Cantilever
|
Thickness (µm) |
3 |
2.5– 3.5 |
|
Width (µm) |
40 |
35 - 45 |
|
|
Length (µm) |
225 |
205 – 245 |
|
|
Resonant Frequency (kHz) |
70 |
60 - 95 |
|
|
Spring Constant (N/m) |
2.9 |
1 - 5 |
|
|
Tip |
Height (µm) |
14 |
12 - 16 |
|
Radius (nm) |
20 |
Less than 25 nm |
|
|
Coating |
Cr (3nm) / Pt (20nm) both sides |
||
