SPI Supplies

AFM Probe Tips

No Tilt Compensation



   

Description:
Applied NanoStructures’ HART0 is designed to fit in all manual and automated AFMs. The probes are made out of heavily doped single crystal silicon. The spike is conical in shape.  Please use matrix below to select the correct model for your application.

Model # HART0


High Aspect Ratio Probes
No Tilt Compensation


Specifications:

 

Parameter

Typical Value

Range

Cantilever 

 

Thickness (µm)

4

3.5 – 4.5

Width (µm)

40

35 - 45

Length (µm)

125

115 – 140

Resonant Frequency (kHz)

300

200 - 400

Spring Constant (N/m)

40

25 - 75

Tip

Height (µm)

14

12 - 16

Radius (nm)

10

Less than 10 nm

Spike Tilt (Sθ) None

Coating

None

   

Ordering Information:

 

Part Number

Spike : Length (SL) X Width (SW)

HART0 – 1

 0.5 um X 100 nm

HART0 – 2

2 um X 300 nm

HART0 – 4

4 um X 400 nm

 



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Thursday October 16, 2008
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