Description:
Applied NanoStructures’ MAGT probe is designed to fit in all AFMs. The
probes are made out of heavily doped single crystal silicon. The tip is
pyramidal in shape.
Specifications:
|
|
Parameter |
Typical Value |
Range |
|
Cantilever
|
Thickness (µm) |
2.5 |
2.0 – 3.0 |
|
Width (µm) |
45 |
40 - 50 |
|
|
Length (µm) |
225 |
215 – 240 |
|
|
Resonant Frequency (kHz) |
60 |
50 - 70 |
|
|
Spring Constant(N/m) |
3 |
1 - 5 |
|
|
Tip |
Height (µm) |
14 |
12 - 16 |
|
Radius (nm) |
30 |
Less than 40 nm |
|
|
Coating |
Magnetic, Both Sides |
||
