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The Electron Flight Simulator™ products are a series of software tools designed to
help the busy microscopist better understand what happens when doing their work, perform
better x-ray microanalysis and make more informed interpretations of their final results.
With the EFS approach one can model virtually any sample,
vary the accelerating voltage and thereby get a picture of where the x-ray signal is coming from. Such
information is invaluable when analyzing thin
films, particles, inclusions, and other difficult samples. And EFS approach
allows up to 5 individual films on a substrate
to be modeled. The user specifies the sample type and chemistry and the software
responds by telling you what is happening inside the sample.
In addition to modeling the
electron interaction volume and the generated x-ray volume, one can also view
the x-rays that are emitted from the sample.
Another new feature: Spectrum Simulator™ generates a synthetic spectrum for any sample. One
can also view a plot showing the intensity of the generated and emitted x-rays
vs. depth in the sample for any x-ray line. This is information you could
only guess at before.
Now you can see what to expect from a sample before you run it!
Operating system requirements:
All Electron Flight Simulator software will run on Windows 3.1, 95, 2000 or XP.
Select from these two Electron Flight Simulator™ products:
To Ask a Question or Make a Comment
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