Tacky Dot™ Slide Arrays
Examples of cross-sections made from Tacky Dot™ Slide collected powders
To make cross-sections, it is necessary to use the SPI# 02394-AB Circle
Analytical Mount to collect the powder onto the slide and then to use the
SPI# 02395-AB PTFE (polytetrafluoroethylene) Block Mount Holder to convert the
particle array into a metallographic mount.
We present here some examples of the kind of results that could be expected
when powers are collected on Tacky Dot Slides and then converted to a
metallographic mount and polished down to reveal the particle "cross-sections".
We also demonstrate the value of a brief exposure to a reactive oxygen
plasma in the SPI Plasma Prep™ II plasma etcher in order to etch off
smeared over resin and also to etch down the polymer matrix so that the
cross- sectioned particles exhibit just a bit more topographical variation
and therefore also, greatly enhanced contrast.
Low magnification view of the particle array in cross-section after being
metallographically polished. Scale bar represents 1 mm.
 |
|
A |
B
|
Higher magnification view of metallographically polished particles, Figure A
being of the "as metallographically prepared" specimen and Figure B being
"after a brief plasma etch" in an
SPI Plasma Prep™ II Plasma Etcher. Note the superior contrast and
generally greater visible detail on the cross-sectioned particles. Scale
bar represents 1 mm.
 |
|
A |
B
|
Higher magnification view of metallographically polished particles, Figure A
being of the "as metallographically prepared" specimen and Figure B being
"after a brief plasma etch". Note the superior contrast and generally
greater visible detail on the cross-sectioned particles. Sale bar
represents 100 µm.
 |
|
A |
B
|
Higher magnification view of metallographically polished particles, Figure A
being of the "as metallographically prepared" specimen and Figure B being
"after a brief plasma etch". Note the superior contrast and generally
greater visible detail on the cross-sectioned particles. Scale bar
represents 100 µm.
 |
|
A |
B
|
Higher magnification view of single cross-sectioned particles (not the same
particle), Figure A "as polished" and Figure B "after plasma etching". Note
the superior particle edge definition and contrast. Scale bar represents
100 µm.
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Sunday March 21, 2010
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