SPI Carbon Sample Bars
Use for STEM examinations in JEOL
®
100CX and other instruments
These spectroscopically pure custom made carbon mounts are ideal for most analyses in the JEOL 100CX STEM. The carbon provides a neutral surface that does not emit x-rays that would be detected by most EDS detectors.
SPI #
each
In Stock
Carbon sample bars
Pack of 10
01687-BA
$32.94
Yes
100
01687-MB
296.47
Yes
To Ask a Question or Make a Comment
To Place an Order or Request a Quote
Return to:
Return to SPI Specimen Mounts for SEM
SPI Supplies Catalog Table of Contents
SPI Supplies Home Page
Tuesday May 13, 2008
©
Copyright
1999 - 2008. By Structure Probe, Inc.
Contacting SPI Supplies and Structure Probe, Inc
.
All rights reserved.
All trademarks and trade names are the property of their respective owners.
Privacy Policy
Worldwide Distributors, Representatives, and Agents
To Ask a Question or Make a Comment
To Ask a Question or Make a Comment
To Place an Order or Request a Quote