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Magnification Reference Standards

Product Description:

These highly innovative and useful and unique products are a magnification calibration standards for ISO-9001:1994 and ISO-17025 certification procedures. These two standards address magnification calibration for light microscopy (transmitted & vertical illumination), confocal microscopy, SEM (backscattered & secondary) and even TEM (using a bulk holder for secondary electron imaging)! This NIST traceable stage micrometer standard has a useful range for horizontal and vertical axes at any magnification from 10X to 50,000X. Can also be used for particle size counting calibration and resolution testing.

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