Magnification Reference Standards
From Geller Microanalytical Laboratory
Product Description:
These highly innovative and useful and unique products are a magnification
calibration standards for ISO-9001:1994 and ISO-17025 certification
procedures. These two standards address magnification calibration for
light microscopy (transmitted & vertical illumination), confocal microscopy,
SEM (backscattered & secondary) and even TEM (using a bulk holder for
secondary electron imaging)! This NIST traceable stage micrometer standard
has a useful range for horizontal and vertical axes at any magnification
from 10X to 50,000X. Can also be used for particle size counting calibration
and resolution testing.
Available Products:
To Ask a Question or Make a Comment
To Place an Order or Request a Quote
Return to:
Tuesday May 13, 2008
© Copyright 2002 - 2008. By Structure Probe, Inc.
Contacting SPI Supplies and Structure Probe, Inc.
All rights reserved.
All trademarks and trade names are the property of their respective owners.
Privacy Policy
Worldwide Distributors, Representatives, and Agents
