SPI Silicon Nitride Membrane Windows™
Some recent publications
We present here publications that have been brought to our attention that
made use of the SPI Silicon Nitride Membrane Window TEM grids:
1. In-situ
TEM observations of abnormal grain growth, coarsening, and
substrate de-wetting in nanocrystalline Ag thin films,
Rand Dannenberg, E. A . Stach, J. R. Groza, and B. J. Dresser,
Thin Solid Films 359 (2000) 1-9.
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Friday July 04, 2008
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