Robinson Backscattered Electron (BSE) Detector for Scanning Electron Microscopes
Warranty Terms and Conditions
ETP Semra Pty Ltd. extends its standard 12 months warranty against defective components or faulty labor, over all items sold bearing the ETP-Semra and Robinson names. The warranty is handled by the customer first contacting SPI Supplies and informing our service personnel of the nature of the problem. SPI Supplies will determine which of the following courses of action is best suited for the particular situation:
Send instruction to the customer for a possible fix and cure of the problem.
Send replacement components and instructions to the customer on a possible fix.
Send a complete replacement item.
In the event of any of the above, the customer is expected to follow the instructions, install the item/components at no additional cost to SPI Supplies. Should a repeat of this action be needed because of a faulty component or incorrect instructions, from SPI Supplies, SPI Supplies may pay for further corrective action, provided SPI Supplies is informed and approve in writing the expenditure before it is incurred.
Request the return of the faulty component to SPI Supplies for rectification at the factory. SPI Supplies will pay all shipping charges provided everything is done according to our instructions.
Faults that are determined by the ETP Semra factory to be due to shipping or other damage, incorrect installation, or problems with the equipment onto which it is installed, will not be covered in the warranty and the factory reserves the right to recover its costs if such is determined to be the case.
Upon completion of a warranty action under any of the above, the warranty period will be extended for a further 12 months. In practice, warranty claims are infrequent and these kinds of scenarios just don't hardly ever happen. The detectors, once installed, seem to just keep going and going and going and going............
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Robinson™ Backscattered Electron (BSE) Detector for Scanning Electron Microscopes
Robinson™ Backscattered Electron (BSE) Detector for Scanning Electron Microscopes
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Sunday March 21, 2010
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