Robinson™ Backscattered Electron (BSE) Detector for Scanning Electron Microscopes
Selected imaging mode as an add-on to your proposed new detector
Introduction:
The Robinson Selected Phase Imaging Module that is an accessory to the
Robinson BSE detector,
selects phases by intensity. This works only with a flat and metallographically polished
surface but for those working with such samples, it is an invaluable add-on and greatly
extends the overall usefulness of a Robinson backscattered electron detector.
The quality of data from the Robinson Selected Imaging Module is highly dependent on the signal
to noise ratio and again, with the scintillator based system, since the signal to noise is so far
superior, the Robinson approach beats out the solid state detector approach hands down!
Perhaps this is why this particular feature is just not offered by any other manufacturer,
including those who manufacture according to the solid state detector approach.
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Monday December 01, 2008
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