SPI Focussed Ion Beam (FIB) Supplies
Select from high quality SPI products for all your FIB lab needs
An FIB milling unit is essentially a scanning electron microscope (SEM) but
with an ion instead of an electron source. Of course there are differences,
for example apertures tend to be consumed faster because the ions tend to
mill away the aperture. In the case of FIB, apertures don't fail because
they have become dirty, they fail because they have been milled away to the
point they have to be replaced.
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Key consumables for FIB Milling:
Apertures
Carbon High Vacuum Compatible
Double Sided Conductive Adhesives
Diamond Support Rings for Ion Milling
Half Grids for FIB and Ion Milling
- Beryllium
- Molybdenum
Inspection Microscopes
Molybdenum Support Rings
Perforated
- Silicon Nitride Membrane Window Grids
- Silicon Oxide Membrane Window Grids
Silver High Vacuum Compatible Double Sided Adhesive Sheets
Silver Paint
SEM Mounts
Slot Grids (Cu, Ni, Au)
Slot Grids, Diamond
Tweezers
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Wednesday May 14, 2008
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