| MAIN COURSE: |
| June 1-5, 2009 Scanning Electron Microscopy and X-ray Microanalysis |
| May 31, 2009 Introduction to SEM and EDS for the New Operator |
| ADVANCED COURSES: |
| June 8-12, 2009 Problem Solving with SEM and X-ray Microanalysis |
| June 8-12, 2009 Quantitative X-ray Microanalysis of Bulk Specimens and Particles |
| June 8-11, 2009 Scanning Transmission Electron Microscopy |
| June 8-11, 2009 Focused Ion Beam (FIB) Instrumentation and Applications |
| June 8-11, 2009 Scanning Probe Microscopy: Introduction to Advanced Applications |
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