| MAIN COURSE: |
| June 3, 2012 Introduction to SEM and EDS for the New Operator |
| June 4-8, 2012 Scanning Electron Microscopy and X-ray Microanalysis |
| ADVANCED COURSES: |
| June 4-7, 2012 Focused Ion Beam (FIB) Instrumentation and Applications |
| June 11-14, 2012 Scanning Probe Microscopy: From Fundamentals to Advanced Applications |
| Not available for 2012. Will be held in 2013. Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications |
| June 11-15, 2012 Problem Solving with SEM, X-Ray Microanalysis, and Electron Backscatter Patterns |
| June 4-8, 2012 Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques |
| June 4-8, 2012 Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques |
| Not available for 2012. Will be held in 2013. Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications |
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