SPI Microscopy Library

Part II. Advance Scanning Electron Microscopy (Labs 8-17):
Backscattered electron imaging. Scanning transmission imaging in the SEM. Low-voltage SEM. High-resolution SEM imaging. SE signal components. Electron channeling contrast. Magnetic contrast. Voltage contrast and EBIC. Environmental SEM. Computer-aided imaging.

Part III: Advanced X-ray Microanalysis (Labs 18-23):
Quantitative wavelength-dispersive X-ray microanalysis. Quantitative wavelength- dispersive X-ray microanalysis. Quantitative energy-dispersive X-ray microanalysis. Light element microanalysis. Trace element microanalysis. Particle and rough surface microanalysis. X-ray images.

Part IV: Analytical Electron Microscopy (Labs 24-27):
Scanning transmission imaging in the AEM. X-ray microanalysis in the AEM. Electron energy loss spectrometry. Convergent beam electron diffraction.

Part V: Guide to Specimen Preparation (Labs 28-30):
Bulk specimens for SEM and X-ray microanalysis. Thin specimens for TEM and AEM. Coating methods.

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