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SPI Microscopy Library

Advances in Optical and Electron Microscopy, Vol. 9
Edited by: R. Barer and V. E. Cosslett ©1987, 352 pgs., illustrated


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Methods for the microscopic examination of matter continue to expand in both their variety and their complexity. Before we have had to time to evaluate full the scanning optical and the photo-electron microscopes, the scanning electron-acoustic instrument is with us. The Auger micro-analytical method has developed a visual display system and it may not be long before laser-excited "destructive analysis" does likewise. It is a testing question as to how far these techniques should be covered in this series. They all involve beams of light or electrons in one way or another. We can no longer appeal to the simple idea that a microscope includes lenses as essential components of an imaging system.
SPI 9115t

Preface for Advances in Optical and Electron Microscopy, Vol.9
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