SPI Microscopy Library

Advanced Scanning Electron Microscopy and Microanalysis
by: D. E. Newbury, D. C. Joy, P. Echlin, C. E. Fiori, and J. I. Goldstein © 1986, 454 pgs., illustrated

The authors provide excellent coverage of the most advanced topics in this rapidly developing field, including: Modeling electron beam-specimen interactions; SEM microcharacterization of semiconductors; electron channeling contrast; magnetic contrast; computer-aided imaging; alternative microanalytical techniques; specimen coating; advances in specimen preparation for biological SEM and cryomicroscopy.

SPI #	Each		In Stock
09074-AB	$ 25.00		Yes

Reviewer's comments:

"........a vast amount of information, extremely clearly presented.....This is an excellent book....."
Quote from Applied Optics

To Ask a Question or Make a Comment

To Place an Order or Request a Quote

Return to:

Monday October 13, 2008 © Copyright 1997 - 2008. By Structure Probe, Inc.
Contacting SPI Supplies and Structure Probe, Inc.
All rights reserved.
All trademarks and trade names are the property of their respective owners.
Privacy Policy

Worldwide Distributors, Representatives, and Agents Flag logo