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SPI Microscopy Library

Maintaining and Monitoring the Transmission Electron Microscope
Author: S. K. Chapman
Oxford University Press© 1986, 71 pages, illustrated


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The book, although published in 1986, is every bit as current today as it was on the day it was published. It is devoted to the distinctly unglamorous subject of electron microscope maintenance, specifically the kind of maintenance that can be done by the average operator, and minimizing those more esoteric procedures usually reserved for the domain of the manufacturer's service engineers. In a few words, this handy volume will enable the typical user with a basic knowledge of a transmission electron microscope to maintain the instrument in optimum condition. Basic monitoring procedures are outlined in order to enable the reader to analyze the instrument's performance, and hence to immediately recognize the presence of any problems that could interfere with that top performance. The various chapters include details of routine maintenance procedures applicable to any make of transmission electron microscope; typical faults, their isolation and standard correction procedures; monitoring the electrical system; and when to try fixing the problem yourself vs. calling in the manufacturer's service people.

The Author is internationally known as "the expert where expert's go" when they have no where else to go. He has formed his own company, "Protain" to provide training, courses, and consulting world wide for those wanting to get the very ultimate out of their electron microscope equipment. The author is always happy to hear from those who have read volume.

Other publications by this author: Working with a Scanning Electron Microscope

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