SPI Microscopy Library

Working with a Scanning Electron Microscope
Author: S. K. Chapman
Lodgemark Press© 1986, 113 pages, illustrated

This book is more like a handbook than a text book. It has been prepared as a joint effort by the world known electron optics consulting firm based in the UK by the name of "Protain" and the ICI Mound Division, Electron Microscope Unit. The author focuses his attention on how one can achieve the optimum performance of an SEM irrespective of how new or old it might be. The text is based on the Protain courses "Understanding and Optimizing SEM Performance", and for the more advanced, "Intesive SEM".

There are a number of unique and innovative approaches taken in this book. For example, throughout the publication the same "standard specimen" is used, the objective being to encourage the reader to "analyze" the various micrographs, so that an understanding can be developed of the changes in an image that result from a change in one of the operating variables, the relationship between the interaction of the electron beam with the specimen, and the nature of the signals collected. Talk directly with the author, S.K. Chapman, with any comments of questions you might have.

SPI #	Each		In Stock
09191-AB	$ 20.00		Yes

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