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SPI Microscopy Library

Stereology and Morphometry In Electron Microscopy: Problems and Solutions
By: Albrecht Reith and Terry M. Mayhew
© 1988, 215 pgs., illustrated


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Introduction to the basic principles and methods of sampling spatial structures for measurement, including measurements of volume, surface, length and number. The book is based on the Scandinavian course on stereology, which has an outstanding reputation for teaching this difficult topic to a broad audience.

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09119-AB$ 25.00 Add to cartYes


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