Introduction to Scanning Transmission Electron Microscopy

By: R.J. Keyse, A.J. Garrat-Reed, P.J. Goodhew and G.W. Lorimer
Taylor and Francis / BIOS Scientific Publishers @ 1997, 114 pgs., illustrated, soft cover

Scanning Transmission Electron Microscopy (STEM) is one of the highest resolution methods for performing microanalysis on thin sections of material. The technique is used in many modern transmission electron microscopes, and an increasing number of specialized instruments dedicated to STEM are being developed. This book provides an up-to-date introduction to the principles and major applications of STEM.

Specific topics include:

Theory of STEM
How to configure an instrument for STEM
Requirements of a good STEM specimen
Bright and dark field imaging techniques
EDX and EELS techniques for further resolution
The future of STEM

STEM is a technique of importance to a growing number of microscopists. This book is essential reading for researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state-of-the-art technique.

SPI #	Each		In Stock
09209-AB	$ 25.00		Yes

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