SPI Microscopy Library

Scanning Tunneling Microscopy and its Applications
Author: Chunli Bai
Springer © 1995, 331 pages, illustrated

This excellent title presents a unified view of the rapidly growing field of STM, and its many derivatives. A thorough discussion of the various principles provides the background of the tunneling phenomena.

This excellent title, part of the Springer Series in Surface Sciences, presents a unified view of the rapidly growing field of STM, and its many derivatives. A thorough discussion of the various principles provides the background of the tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations, and provides hints toward further trends.

SPI #	Each		In Stock
09203-AB	$ 25.00		Yes

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