Ion Beam Thinning
Use our Gatan duo-beam ion mill for those most important of samples requiring TEM
Includes complex sample preparation, bright field TEM and selected area
electron diffraction (SAED). Ideal for substrates such as Si, GaAs, Ge,
CdTe, diamond, and sapphire. Cross-sectional views. Available
instrumentation includes tripod polishing, dimpling, and ion mill.
type of samples price per sample including TEM
Silicon Substrates $ 1,150.00*
Other Substrates 2,500.00*
Multiple sample discount available. Additional $ 1,500.00 fee for the
first sample of a particular construction.
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Thursday February 09, 2012
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