SPI Supplies

Ion Beam Thinning

Use our Gatan duo-beam ion mill for those most important of samples requiring TEM

Includes complex sample preparation, bright field TEM and selected area electron diffraction (SAED). Ideal for substrates such as Si, GaAs, Ge, CdTe, diamond, and sapphire. Cross-sectional views. Available instrumentation includes tripod polishing, dimpling, and ion mill.

type of samples      price per sample including TEM

Silicon Substrates      $ 1,150.00*

Other Substrates          2,500.00*

Multiple sample discount available. Additional $ 1,500.00 fee for the first sample of a particular construction.